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35 lines
1.7 KiB
Markdown
35 lines
1.7 KiB
Markdown
# Test for `periph/gpio_ll`
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This application will use two output and two input GPIOs, which have to be
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connected via a jumper wire. The test will change the value of the two pins
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output pins and use the input pins to read the value back in. If the value read
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doesn't match the expected result, the test aborts and fails.
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If IRQ support is provided, the test will additionally walk through every IRQ
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configuration for the first GPIO pin given and iterate over any trigger
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condition possible. It will check that edge trigger and (if supported) level
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trigger IRQs trigger exactly on the configured triggers.
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## Configuration
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Configure in the `Makefile` or set via environment variables the number of
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the output GPIO port to use via the `PORT_OUT` variable. The `PIN_OUT_0` and
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`PIN_OUT_1` variables select the pins to use within that GPIO port. The input
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GPIO port is set via `PORT_IN`. Both `PORT_IN == PORT_OUT` and
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`PORT_IN != PORT_OUT` is valid. The input pin number within `PORT_IN` are set
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via `PIN_IN_0` and `PIN_IN_1`. `PIN_IN_0` has to be wired to `PIN_OUT_0`, and
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`PIN_IN_1` to `PIN_OUT_1`.
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## Expected Failures
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Implementations are allowed to not electrically disconnect GPIO pins in state
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`GPIO_DISCONNECT`. The test will however test for pins to be electrically
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disconnected. For every MCU supported by GPIO LL so far at least some pins can
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be electrically disconnected. You might need to change the GPIO pins tested
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if the test for disconnected GPIOs being also electrically disconnected.
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When features such as `periph_gpio_ll_pull_up` or `periph_gpio_ll_open_drain`
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are provided, this test expect those to be available on the tested pins. If
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those features are not available on all pins, suitable pins need to be
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selected for the test to pass.
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