This makes it easier to use common error reporting such as `strerror()`
or `tiny_strerror()` to give more insight on why something failed.
The custom error codes via `enum` have been updated to be synonymous
with the `errno` codes for backward compatibility.
In addition, `pcf857x_init()` has been updated to no longer or
together the return code, but rather abort on the first fail transaction
and return the error code as is. Otherwise (when both fail due to
different error codes) the returned error code may be garbage.
The `SWJ_CFG` field of the `AFIO_MAPR` register is write only and values
read are undefined (random). Hence, using `AFIO->MAPR |= mask;` to
enable flags can corrupt the state of the `SWJ_CFG` (configure it to
an unintended value).
Two helper functions have been introduced:
- `afio_mapr_read()` reads the value, but sanitizes the `SWJ_CFG` field
to zero
- `afio_mapr_write()` writes the given value, but applies the `SWJ_CFG`
configured by the board before writing.
Finally, the `nucleo-f103rb` and `bluepill*`/`blackpill*` boards have
been updated to no longer specify `STM32F1_DISABLE_JTAG`, as this
is handled by the `SWJ_CFG` setting (which defaults to disabling JTAG).
- Detect when the same timer is used by `ztimer` (pulled in as
dependency for a peripheral driver, e.g. `periph_adc` on STM32F3) and
the test application
- Try to provide a better default (e.g. `TIMER_DEV(1)` when
`ztimer_periph_timer` is in use, `TIMER_DEV(0)` otherwise)
The R-2R resistor ladder dac --> ADC test was disabled due to a bug in
the v0.1 version of the shield. Since this has been fixed in v0.2 and
v0.3 of the shield, it can be re-enabled.
The comment regarding the high accuracy of the resistor is dropped, as
v0.3 has been ordered with cost efficient resistors rather than with
accurate ones. As a result, the tolerance for error has been increased
to 10%. This quite a bit more lax than I have hoped for, but false
positives would be something to avoid.
- fix a copy-paste error (`TIMER_FREQ_UART_TEST` was used in the SPI
test, but that should be `TIMER_FREQ_SPI_TEST`)
- use 400 kHz as slow SPI frequency, as faster STM32 MCUs just cannot
divide the APB clock down to 100 kHz
- when detailed output is enabled, print the SPI clock in addition to
the SPI mode to ease figuring out what went wrong
- only have one `FAILURE` message for a too fast byte transfer per
check, rather than per transmitted byte, to reduce the noise
- work around a bug of `periph_timer` on STM32 by reducing the clock
speed of the timer for the SPI test
The macro `ARDUINO_SPI_D11D12D13` is used to refer to the SPI bus
on the pins D11/D12/D13 on Arduino UNO compatible boards. For all
Nucleo64 boards this is `SPI_DEV(0)`, but for this board `SPI_DEV(0)`
is internally connected to the radio. Instead `SPI_DEV(1)` is connected
to the correct pins. This provides the macro explicitly in
`periph_conf.h`, which takes preference over the fallback in
`boards/common/nucleo64` when provided.
The test should execute only with `make test-with-config` and not with
`make test`, as boards without the shield cannot pass the test.
For some reason I accidentally added both variants, which makes no
sense. This drops the `make test` variant.
Finally, the `README.md` is updated to refer to `make test-with-config`
instead of `make test`.
