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unittests: Add analog_util tests

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This commit is contained in:
Joakim Nohlgård 2018-02-16 13:01:31 +01:00
parent 57f6081960
commit 69e9767184
4 changed files with 110 additions and 0 deletions
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1
tests/unittests/tests-analog_util/Makefile Normal file
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include $(RIOTBASE)/Makefile.base

1
tests/unittests/tests-analog_util/Makefile.include Normal file
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USEMODULE += analog_util

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tests/unittests/tests-analog_util/tests-analog_util.c Normal file
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/*
* Copyright (C) 2018 Eistec AB
*
* This file is subject to the terms and conditions of the GNU Lesser
* General Public License v2.1. See the file LICENSE in the top level
* directory for more details.
*/
#include "embUnit.h"
#include "tests-analog_util.h"
#include "analog_util.h"
#define ENABLE_DEBUG (0)
#include "debug.h"
typedef struct {
int32_t expected;
int sample;
int32_t min;
int32_t max;
adc_res_t res;
} test_values_t;
/* Arbitrarily chosen test vectors */
/* TODO: Choose test vectors in a more qualified manner to catch any edge cases */
static test_values_t test_data[] = {
{ 0L, 0, 0L, 10000L, ADC_RES_16BIT},
{ 1000L, 0, 1000L, 0L, ADC_RES_16BIT},
{ 65535L, 65535, 0L, 65536L, ADC_RES_16BIT},
{ 32768L, 128, 0L, 65536L, ADC_RES_8BIT},
{ 8192L, 128, 0L, 65536L, ADC_RES_10BIT},
{ 256L, 1, 0L, 65536L, ADC_RES_8BIT},
{ 65280L, 255, 0L, 65536L, ADC_RES_8BIT},
{ 1039L, 10, 1000L, 2000L, ADC_RES_8BIT},
{ 17324L, 3000, 10000L, 20000L, ADC_RES_12BIT},
{ 11831L, 3000, 10000L, 20000L, ADC_RES_14BIT},
{ 2301L, 3000, 13L, 50000L, ADC_RES_16BIT},
{ -134L, 56789, -1000L, 0L, ADC_RES_16BIT},
{ 16062L, 45671, 30000L, 10000L, ADC_RES_16BIT},
{ -2535L, 30000, -30000L, 30000L, ADC_RES_16BIT},
{ 0L, 65535, 65535L, 0L, ADC_RES_16BIT},
{ 65534L, 1, 65535L, 0L, ADC_RES_16BIT},
{ 3972L, 9876, 10000L, 0L, ADC_RES_14BIT},
};
#define TEST_DATA_NUMOF (sizeof(test_data) / sizeof(test_data[0]))
static void test_adc_util_map(void)
{
for (unsigned int k = 0; k < TEST_DATA_NUMOF; ++k) {
test_values_t *testp = &test_data[k];
int32_t res = adc_util_map(testp->sample, testp->res, testp->min, testp->max);
TEST_ASSERT_EQUAL_INT(testp->expected, res);
}
}
Test *tests_adc_util_tests(void)
{
EMB_UNIT_TESTFIXTURES(fixtures) {
new_TestFixture(test_adc_util_map),
};
EMB_UNIT_TESTCALLER(adc_util_tests, NULL, NULL, fixtures);
return (Test *)&adc_util_tests;
}
void tests_analog_util(void)
{
TESTS_RUN(tests_adc_util_tests());
}

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tests/unittests/tests-analog_util/tests-analog_util.h Normal file
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/*
* Copyright (C) 2018 Eistec AB
*
* This file is subject to the terms and conditions of the GNU Lesser
* General Public License v2.1. See the file LICENSE in the top level
* directory for more details.
*/
/**
* @addtogroup unittests
* @{
*
* @file
* @brief Unittests for the ``adc_utils`` header
*
* @author Joakim Nohlgård <joakim.nohlgard@eistec.se>
*/
#ifndef TESTS_ANALOG_UTIL_H
#define TESTS_ANALOG_UTIL_H
#include "embUnit/embUnit.h"
#ifdef __cplusplus
extern "C" {
#endif
/**
* @brief The entry point of this test suite.
*/
void tests_adc_util(void);
#ifdef __cplusplus
}
#endif
#endif /* TESTS_ANALOG_UTIL_H */
/** @} */