diff --git a/tests/unittests/tests-analog_util/Makefile b/tests/unittests/tests-analog_util/Makefile new file mode 100644 index 0000000000..48422e909a --- /dev/null +++ b/tests/unittests/tests-analog_util/Makefile @@ -0,0 +1 @@ +include $(RIOTBASE)/Makefile.base diff --git a/tests/unittests/tests-analog_util/Makefile.include b/tests/unittests/tests-analog_util/Makefile.include new file mode 100644 index 0000000000..96a4561767 --- /dev/null +++ b/tests/unittests/tests-analog_util/Makefile.include @@ -0,0 +1 @@ +USEMODULE += analog_util diff --git a/tests/unittests/tests-analog_util/tests-analog_util.c b/tests/unittests/tests-analog_util/tests-analog_util.c new file mode 100644 index 0000000000..a46f1e169f --- /dev/null +++ b/tests/unittests/tests-analog_util/tests-analog_util.c @@ -0,0 +1,72 @@ +/* + * Copyright (C) 2018 Eistec AB + * + * This file is subject to the terms and conditions of the GNU Lesser + * General Public License v2.1. See the file LICENSE in the top level + * directory for more details. + */ + +#include "embUnit.h" +#include "tests-analog_util.h" + +#include "analog_util.h" + +#define ENABLE_DEBUG (0) +#include "debug.h" + +typedef struct { + int32_t expected; + int sample; + int32_t min; + int32_t max; + adc_res_t res; +} test_values_t; + +/* Arbitrarily chosen test vectors */ +/* TODO: Choose test vectors in a more qualified manner to catch any edge cases */ +static test_values_t test_data[] = { + { 0L, 0, 0L, 10000L, ADC_RES_16BIT}, + { 1000L, 0, 1000L, 0L, ADC_RES_16BIT}, + { 65535L, 65535, 0L, 65536L, ADC_RES_16BIT}, + { 32768L, 128, 0L, 65536L, ADC_RES_8BIT}, + { 8192L, 128, 0L, 65536L, ADC_RES_10BIT}, + { 256L, 1, 0L, 65536L, ADC_RES_8BIT}, + { 65280L, 255, 0L, 65536L, ADC_RES_8BIT}, + { 1039L, 10, 1000L, 2000L, ADC_RES_8BIT}, + { 17324L, 3000, 10000L, 20000L, ADC_RES_12BIT}, + { 11831L, 3000, 10000L, 20000L, ADC_RES_14BIT}, + { 2301L, 3000, 13L, 50000L, ADC_RES_16BIT}, + { -134L, 56789, -1000L, 0L, ADC_RES_16BIT}, + { 16062L, 45671, 30000L, 10000L, ADC_RES_16BIT}, + { -2535L, 30000, -30000L, 30000L, ADC_RES_16BIT}, + { 0L, 65535, 65535L, 0L, ADC_RES_16BIT}, + { 65534L, 1, 65535L, 0L, ADC_RES_16BIT}, + { 3972L, 9876, 10000L, 0L, ADC_RES_14BIT}, +}; + +#define TEST_DATA_NUMOF (sizeof(test_data) / sizeof(test_data[0])) + +static void test_adc_util_map(void) +{ + for (unsigned int k = 0; k < TEST_DATA_NUMOF; ++k) { + test_values_t *testp = &test_data[k]; + int32_t res = adc_util_map(testp->sample, testp->res, testp->min, testp->max); + TEST_ASSERT_EQUAL_INT(testp->expected, res); + } +} + +Test *tests_adc_util_tests(void) +{ + EMB_UNIT_TESTFIXTURES(fixtures) { + new_TestFixture(test_adc_util_map), + }; + + EMB_UNIT_TESTCALLER(adc_util_tests, NULL, NULL, fixtures); + + return (Test *)&adc_util_tests; +} + +void tests_analog_util(void) +{ + TESTS_RUN(tests_adc_util_tests()); +} diff --git a/tests/unittests/tests-analog_util/tests-analog_util.h b/tests/unittests/tests-analog_util/tests-analog_util.h new file mode 100644 index 0000000000..273ac33bbf --- /dev/null +++ b/tests/unittests/tests-analog_util/tests-analog_util.h @@ -0,0 +1,36 @@ +/* + * Copyright (C) 2018 Eistec AB + * + * This file is subject to the terms and conditions of the GNU Lesser + * General Public License v2.1. See the file LICENSE in the top level + * directory for more details. + */ + +/** + * @addtogroup unittests + * @{ + * + * @file + * @brief Unittests for the ``adc_utils`` header + * + * @author Joakim NohlgÄrd + */ +#ifndef TESTS_ANALOG_UTIL_H +#define TESTS_ANALOG_UTIL_H +#include "embUnit/embUnit.h" + +#ifdef __cplusplus +extern "C" { +#endif + +/** +* @brief The entry point of this test suite. +*/ +void tests_adc_util(void); + +#ifdef __cplusplus +} +#endif + +#endif /* TESTS_ANALOG_UTIL_H */ +/** @} */