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RIOT/tests/periph/selftest_shield/main.c
Marian Buschsieweke fd30434921
tests/periph/selftest_shield: fix GPIO IRQ testing 
The GPIO IRQ tests had a side-effect that IRQs remained configured after
the test case was complete. This caused stray IRQs to trigger on
SAM0 MCUs and they consequently (and incorrectly) failed the test.
2024-11-19 22:25:20 +01:00

1141 lines
34 KiB
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/*
* Copyright (C) 2023 Otto-von-Guericke-Universität Magdeburg
*
* This file is subject to the terms and conditions of the GNU Lesser
* General Public License v2.1. See the file LICENSE in the top level
* directory for more details.
*/
/**
* @ingroup tests
* @{
*
* @file
* @brief Test application for Peripheral Self-Testing using the
* Peripheral Selftest Shield
*
* @author Marian Buschsieweke <marian.buschsieweke@ovgu.de>
*
* @}
*/
#include <inttypes.h>
#include <stdbool.h>
#include <stdint.h>
#include <stdatomic.h>
#include <stdio.h>
#include <stdlib.h>
#include <string.h>
#include "architecture.h"
#include "arduino_iomap.h"
#include "macros/units.h"
#include "macros/utils.h"
#include "modules.h"
#include "pcf857x.h"
#include "periph/adc.h"
#include "periph/gpio.h"
#include "periph/pwm.h"
#include "periph/spi.h"
#include "periph/timer.h"
#include "periph/uart.h"
#include "stdio_uart.h" /* for STDIO_UART_DEV */
#include "tiny_strerror.h"
/* BEGIN: controls of the behavior of the testing app: */
#ifndef STOP_ON_FAILURE
#define STOP_ON_FAILURE 0
#endif
#ifndef DETAILED_OUTPUT
#define DETAILED_OUTPUT 0
#endif
/* END: controls of the behavior of the testing app: */
/* In order to run the periph_uart test all of the following needs to be true:
* - periph_uart needs to be used
* - an I/O mapping for the UART at D0/D1 needs to be provided
* - this UART dev is not busy with stdio
*/
#if defined(ARDUINO_UART_D0D1) && defined(MODULE_PERIPH_UART)
# define ENABLE_UART_TEST (STDIO_UART_DEV != ARDUINO_UART_D0D1)
# define UART_TEST_DEV ARDUINO_UART_D0D1
#else
# define ENABLE_UART_TEST 0
#endif
/* In order to run the periph_pwm test, all of the following needs to be true:
* - periph_pwm needs to be used (so that we actually have something to test)
* - periph_adc needs to be used (so that we can validate the output duty cycle)
* - At least one of:
* - Arduino I/O mapping for PWM on D5 *AND* analog pin A2 is provided
* - Arduino I/O mapping for PWM on D6 *AND* analog pin A1 is provided
*/
#if defined(MODULE_PERIPH_PWM) && defined(MODULE_PERIPH_ADC)
# if defined(ARDUINO_PIN_5_PWM_DEV) && defined(ARDUINO_A2)
# define ENABLE_PWM_TEST_D5 1
# else
# define ENABLE_PWM_TEST_D5 0
# endif
# if defined(ARDUINO_PIN_6_PWM_DEV) && defined(ARDUINO_A1)
# define ENABLE_PWM_TEST_D6 1
# else
# define ENABLE_PWM_TEST_D6 0
# endif
# define ENABLE_PWM_TEST (ENABLE_PWM_TEST_D5 || ENABLE_PWM_TEST_D6)
#else
# define ENABLE_PWM_TEST 0
# define ENABLE_PWM_TEST_D5 0
# define ENABLE_PWM_TEST_D6 0
#endif
/* In order to run the periph_adc test, we need:
* - periph_adc support (so that we have something to test)
* - Arduino I/O mapping for ADC (so that we know which line to test)
* - The PCF857x driver (so that we can control the R-2R resistor ladder
* connected to the GPIO expander).
*/
#if defined(MODULE_PERIPH_ADC) && defined(ARDUINO_A0) && defined(MODULE_PCF857X)
# define ENABLE_ADC_TEST 1
#else
# define ENABLE_ADC_TEST 0
#endif
/* We want the code to be compile-tested even when tests are disabled. We
* provide dummy parameters for the tests when they are off. The actual
* values don't matter, as the tests will be disabled anyway when the
* parameters are missing. But having the compiler checking the syntax and
* doing static analysis is useful in any case. */
#ifndef ARDUINO_PIN_5_PWM_DEV
# define ARDUINO_PIN_5_PWM_DEV -1
# define ARDUINO_PIN_5_PWM_CHAN -1
#endif
#ifndef ARDUINO_PIN_6_PWM_DEV
# define ARDUINO_PIN_6_PWM_DEV -1
# define ARDUINO_PIN_6_PWM_CHAN -1
#endif
#ifndef ARDUINO_A0
# define ARDUINO_A0 -1
#endif
#ifndef ARDUINO_A1
# define ARDUINO_A1 -1
#endif
#ifndef ARDUINO_A2
# define ARDUINO_A2 -1
#endif
#ifndef UART_TEST_DEV
# define UART_TEST_DEV UART_DEV(0)
#endif
#ifndef TIMER
# if IS_USED(MODULE_ZTIMER_PERIPH_TIMER) && CONFIG_ZTIMER_USEC_DEV == TIMER_DEV(0)
# define TIMER TIMER_DEV(1)
# else
# define TIMER TIMER_DEV(0)
# endif
#endif
#if IS_USED(MODULE_ZTIMER_PERIPH_TIMER)
# if CONFIG_ZTIMER_USEC_DEV == TIMER
# error "Same timer used for ztimer and test"
# endif
#endif
/* A higher clock frequency is beneficial in being able to actually measure the
* difference of half a SPI clock cycle when clock phase is 1, compared to
* clock phase being 0. Most MCUs can clock their timers from the core clock
* directly, so the CPU clock is the highest clock frequency available. But
* some can't, so we handle them here explicitly. */
#ifndef TIMER_FREQ_SPI_TEST
# if defined(CPU_SAM3) || defined(CPU_STM32)
# define TIMER_FREQ_SPI_TEST CLOCK_CORECLOCK / 4
# elif defined(CPU_NRF52) || defined(CPU_NRF51)
# define TIMER_FREQ_SPI_TEST MHZ(16)
# else
# define TIMER_FREQ_SPI_TEST CLOCK_CORECLOCK
# endif
#endif
/* for the UART test a slower frequency is more beneficial. We assume the
* timer to be 16 bit (tossing away the upper 16 bit of 32 bit timers) to
* ease the test. But the duration for transferring 8 bytes of UART data in
* ticks easily overflows 16 bit at higher frequencies, so we just go for
* a lower frequency instead. */
#ifndef TIMER_FREQ_UART_TEST
# if defined(__AVR__)
# define TIMER_FREQ_UART_TEST CLOCK_CORECLOCK / 64
# else
# define TIMER_FREQ_UART_TEST MHZ(1)
# endif
#endif
static const char testdata[8] = "Selftest";
static const spi_t spi_buses[] = {
#ifdef ARDUINO_SPI_D11D12D13
ARDUINO_SPI_D11D12D13,
#endif
#ifdef ARDUINO_SPI_ISP
ARDUINO_SPI_ISP,
#endif
};
static const gpio_t spi_clk_check_pins[] = {
#ifdef ARDUINO_SPI_D11D12D13
PCF857X_GPIO_PIN(0, 2),
#endif
#ifdef ARDUINO_SPI_ISP
PCF857X_GPIO_PIN(0, 3),
#endif
};
static struct {
char data[8];
uint8_t pos;
} serial_buf;
/* This module is only used when both periph_i2c and the Arduino I/O
* mapping are present. If this module is not used, this test is optimized
* out as dead branch. We still want the compile test, though. */
static const pcf857x_params_t params = {
#ifdef MODULE_PCF857X
.dev = ARDUINO_I2C_UNO,
.exp = PCF857X_EXP_PCF8574,
#endif
};
static pcf857x_t egpios;
/* Some tests may pass due to luck (e.g. when expecting a pull up but input
* is floating, it will still get lucky from time to time). We repeat those
* in a loop to have some confidence that the test is consistently passing */
static const unsigned flaky_test_repetitions = 100;
/* We are trying to not spent much memory on error message for compatibility
* with as many boards as possible. The idea is that the line number where a
* test failed and careful commenting in the code provides the same level of
* insight with only a little inconvenience of having to open the editor. */
static void print_test_failed(uint16_t line)
{
printf("FAILURE in " __FILE__ ":%" PRIu16 "\n", line);
}
static bool do_test(bool failed, uint16_t line)
{
if (failed) {
print_test_failed(line);
if (STOP_ON_FAILURE) {
printf("Stopping, as STOP_ON_FAILURE==1\n");
ARCHITECTURE_BREAKPOINT(1);
while (1) {
/* stop */
}
}
}
return failed;
}
static void MAYBE_UNUSED do_assert(bool failed, uint16_t line)
{
if (failed) {
printf("CRITICAL ");
print_test_failed(line);
ARCHITECTURE_BREAKPOINT(1);
while (1) {
/* stop */
}
}
}
static void do_assert_no_error(int retval, uint16_t line)
{
if (retval != 0) {
printf("ERROR in " __FILE__ ":%" PRIu16 " with code %s\n",
line, tiny_strerror(retval));
ARCHITECTURE_BREAKPOINT(1);
while (1) {
/* stop */
}
}
}
static void print_result(bool failed)
{
if (failed) {
printf("[FAILED]\n");
}
else {
printf("[OK]\n");
}
}
static void print_skipped(void)
{
printf("(skipped)\n");
}
static void _print_start(const char *name, const char *detail, uint16_t line)
{
if (DETAILED_OUTPUT) {
printf("Starting test for %s (%s) at " __FILE__ ":%" PRIu16"\n", name,
detail, line);
}
else {
printf("Starting test for %s at " __FILE__ ":%" PRIu16"\n", name,
line);
}
}
#if DETAILED_OUTPUT
# define print_start(name, detail) _print_start(name, detail, __LINE__)
#else
# define print_start(name, detail) _print_start(name, NULL, __LINE__)
#endif
/**
* @brief Expression @p x must evaluate, otherwise fail but continue other
* tests
*
* @pre The test is safe to continue even if the test fails
*/
#define TEST(x) do_test(!(x), __LINE__)
/**
* @brief Expression @p x must evaluate, otherwise fail and abort
*
* @pre The test is ***NOT*** safe to continue if the test fails
*/
#define ASSERT(x) do_assert(!(x), __LINE__)
/**
* @brief The expression @p must return 0, otherwise abort
*
* @pre The return value will be a positive or negative errno code, if it
* is not zero
*
* This prints the errno code and aborts if @p x is not evaluating to zero
*/
#define ASSERT_NO_ERROR(x) do_assert_no_error(x, __LINE__)
static void stupid_delay(unsigned count)
{
while (count > 0) {
/* tell optimizer that the value of `count` is used and changed, so
* that the down-counting loop is not detected as dead code */
__asm__ volatile (
""
/* outputs: */
: "+r"(count)
/* inputs: */
:
/* clobbers: */
);
count--;
}
}
static void brief_delay(void)
{
stupid_delay(100);
}
static void long_delay(void)
{
stupid_delay(10000);
}
static bool periph_gpio_test_push_pull(void)
{
bool failed = false;
print_start("GPIO", "push-pull");
ASSERT_NO_ERROR(gpio_init(ARDUINO_PIN_3, GPIO_IN));
ASSERT_NO_ERROR(gpio_init(ARDUINO_PIN_4, GPIO_OUT));
gpio_clear(ARDUINO_PIN_4);
for (unsigned i = 0; i < flaky_test_repetitions; i++) {
failed |= TEST(gpio_read(ARDUINO_PIN_3) == 0);
}
gpio_set(ARDUINO_PIN_4);
for (unsigned i = 0; i < flaky_test_repetitions; i++) {
failed |= TEST(gpio_read(ARDUINO_PIN_3) != 0);
}
print_result(failed);
return failed;
}
static bool periph_gpio_test_input_pull_up(void)
{
bool failed = false;
print_start("GPIO", "input pull-up");
ASSERT_NO_ERROR(gpio_init(ARDUINO_PIN_4, GPIO_IN));
if (gpio_init(ARDUINO_PIN_3, GPIO_IN_PU) == 0) {
/* give pull resistor a little time to pull */
brief_delay();
/* pull up should pull both D3 and D4 up, as D4 is connected to D3 via
* the testing shield */
for (unsigned i = 0; i < flaky_test_repetitions; i++) {
failed |= TEST(gpio_read(ARDUINO_PIN_3) != 0);
failed |= TEST(gpio_read(ARDUINO_PIN_4) != 0);
}
/* push/pull on D4 should still be able to force down D3 */
ASSERT_NO_ERROR(gpio_init(ARDUINO_PIN_4, GPIO_OUT));
gpio_clear(ARDUINO_PIN_4);
for (unsigned i = 0; i < flaky_test_repetitions; i++) {
failed |= TEST(gpio_read(ARDUINO_PIN_3) == 0);
}
print_result(failed);
}
else {
print_skipped();
}
return failed;
}
static bool periph_gpio_test_input_pull_down(void)
{
bool failed = false;
print_start("GPIO", "input pull-down");
ASSERT_NO_ERROR(gpio_init(ARDUINO_PIN_4, GPIO_IN));
if (gpio_init(ARDUINO_PIN_3, GPIO_IN_PD) == 0) {
/* give pull resistor a little time to pull */
brief_delay();
/* pull down should pull both D3 and D4 down, as D4 is connected to D3
* via the testing shield */
for (unsigned i = 0; i < flaky_test_repetitions; i++) {
failed |= TEST(gpio_read(ARDUINO_PIN_3) == 0);
failed |= TEST(gpio_read(ARDUINO_PIN_4) == 0);
}
/* push/pull on D4 should still be able to force up D3 */
ASSERT_NO_ERROR(gpio_init(ARDUINO_PIN_4, GPIO_OUT));
gpio_set(ARDUINO_PIN_4);
for (unsigned i = 0; i < flaky_test_repetitions; i++) {
failed |= TEST(gpio_read(ARDUINO_PIN_3) != 0);
}
print_result(failed);
}
else {
print_skipped();
}
return failed;
}
static bool periph_gpio_test_open_drain_pull_up(void)
{
bool failed = false;
print_start("GPIO", "open-drain pull-up");
ASSERT_NO_ERROR(gpio_init(ARDUINO_PIN_4, GPIO_IN));
if (gpio_init(ARDUINO_PIN_3, GPIO_OD_PU) == 0) {
gpio_set(ARDUINO_PIN_3);
/* give pull resistor a little time to pull */
brief_delay();
for (unsigned i = 0; i < flaky_test_repetitions; i++) {
failed |= TEST(gpio_read(ARDUINO_PIN_4) != 0);
}
gpio_clear(ARDUINO_PIN_3);
for (unsigned i = 0; i < flaky_test_repetitions; i++) {
failed |= TEST(gpio_read(ARDUINO_PIN_4) == 0);
}
print_result(failed);
}
else {
print_skipped();
}
return failed;
}
static bool periph_gpio_test_open_drain_no_pull_up(void)
{
bool failed = false;
print_start("GPIO", "open-drain no-pull-up");
/* we cannot test without pull up, but the input pin may have the pull
* up just as well */
if ((gpio_init(ARDUINO_PIN_3, GPIO_OD) == 0)
&& (gpio_init(ARDUINO_PIN_4, GPIO_IN_PU))) {
gpio_set(ARDUINO_PIN_3);
/* give pull resistor a little time to pull */
brief_delay();
for (unsigned i = 0; i < flaky_test_repetitions; i++) {
failed |= TEST(gpio_read(ARDUINO_PIN_4) != 0);
}
gpio_clear(ARDUINO_PIN_3);
for (unsigned i = 0; i < flaky_test_repetitions; i++) {
failed |= TEST(gpio_read(ARDUINO_PIN_4) == 0);
}
print_result(failed);
}
else {
print_skipped();
}
return failed;
}
static bool periph_gpio_test(void)
{
bool failed = false;
failed |= periph_gpio_test_push_pull();
failed |= periph_gpio_test_input_pull_up();
failed |= periph_gpio_test_input_pull_down();
failed |= periph_gpio_test_open_drain_pull_up();
failed |= periph_gpio_test_open_drain_no_pull_up();
return failed;
}
static void gpio_cb(void *arg)
{
atomic_uint *cnt = arg;
atomic_fetch_add(cnt, 1);
}
static bool periph_gpio_irq_test_falling(void)
{
bool failed = false;
print_start("GPIO-IRQ", "falling-edge");
atomic_uint cnt = 0;
ASSERT_NO_ERROR(gpio_init(ARDUINO_PIN_4, GPIO_OUT));
gpio_clear(ARDUINO_PIN_4);
ASSERT_NO_ERROR(gpio_init_int(ARDUINO_PIN_3, GPIO_IN, GPIO_FALLING, gpio_cb, &cnt));
/* no stray IRQ */
brief_delay();
failed |= TEST(atomic_load(&cnt) == 0);
/* no IRQ on false edge */
gpio_set(ARDUINO_PIN_4);
brief_delay();
failed |= TEST(atomic_load(&cnt) == 0);
/* one IRQ on matching edge */
gpio_clear(ARDUINO_PIN_4);
brief_delay();
failed |= TEST(atomic_load(&cnt) == 1);
/* still no IRQ on false edge */
gpio_set(ARDUINO_PIN_4);
brief_delay();
failed |= TEST(atomic_load(&cnt) == 1);
/* another IRQ on matching edge */
gpio_clear(ARDUINO_PIN_4);
brief_delay();
failed |= TEST(atomic_load(&cnt) == 2);
/* no IRQs while disabled */
gpio_irq_disable(ARDUINO_PIN_3);
gpio_set(ARDUINO_PIN_4);
brief_delay();
gpio_clear(ARDUINO_PIN_4);
brief_delay();
gpio_set(ARDUINO_PIN_4);
brief_delay();
gpio_clear(ARDUINO_PIN_4);
brief_delay();
failed |= TEST(atomic_load(&cnt) == 2);
/* no stray IRQs when re-enabled */
gpio_irq_enable(ARDUINO_PIN_3);
failed |= TEST(atomic_load(&cnt) == 2);
/* still no IRQ on false edge */
gpio_set(ARDUINO_PIN_4);
brief_delay();
failed |= TEST(atomic_load(&cnt) == 2);
/* another IRQ on matching edge */
gpio_clear(ARDUINO_PIN_4);
brief_delay();
failed |= TEST(atomic_load(&cnt) == 3);
/* disable IRQ again to not have side effects */
gpio_irq_disable(ARDUINO_PIN_3);
print_result(failed);
return failed;
}
static bool periph_gpio_irq_test_rising(void)
{
bool failed = false;
print_start("GPIO-IRQ", "rising-edge");
atomic_uint cnt = 0;
ASSERT_NO_ERROR(gpio_init(ARDUINO_PIN_4, GPIO_OUT));
gpio_set(ARDUINO_PIN_4);
ASSERT_NO_ERROR(gpio_init_int(ARDUINO_PIN_3, GPIO_IN, GPIO_RISING, gpio_cb, &cnt));
/* no stray IRQ */
brief_delay();
failed |= TEST(atomic_load(&cnt) == 0);
/* no IRQ on false edge */
gpio_clear(ARDUINO_PIN_4);
brief_delay();
failed |= TEST(atomic_load(&cnt) == 0);
/* one IRQ on matching edge */
gpio_set(ARDUINO_PIN_4);
brief_delay();
failed |= TEST(atomic_load(&cnt) == 1);
/* still no IRQ on false edge */
gpio_clear(ARDUINO_PIN_4);
brief_delay();
failed |= TEST(atomic_load(&cnt) == 1);
/* another IRQ on matching edge */
gpio_set(ARDUINO_PIN_4);
brief_delay();
failed |= TEST(atomic_load(&cnt) == 2);
/* no IRQs while disabled */
gpio_irq_disable(ARDUINO_PIN_3);
gpio_clear(ARDUINO_PIN_4);
brief_delay();
gpio_set(ARDUINO_PIN_4);
brief_delay();
gpio_clear(ARDUINO_PIN_4);
brief_delay();
gpio_set(ARDUINO_PIN_4);
brief_delay();
failed |= TEST(atomic_load(&cnt) == 2);
/* no stray IRQs when re-enabled */
gpio_irq_enable(ARDUINO_PIN_3);
failed |= TEST(atomic_load(&cnt) == 2);
/* still no IRQ on false edge */
gpio_clear(ARDUINO_PIN_4);
brief_delay();
failed |= TEST(atomic_load(&cnt) == 2);
/* another IRQ on matching edge */
gpio_set(ARDUINO_PIN_4);
brief_delay();
failed |= TEST(atomic_load(&cnt) == 3);
/* disable IRQ again to not have side effects */
gpio_irq_disable(ARDUINO_PIN_3);
print_result(failed);
return failed;
}
static bool periph_gpio_irq_test_both(void)
{
bool failed = false;
print_start("GPIO-IRQ", "both-edges");
atomic_uint cnt = 0;
ASSERT_NO_ERROR(gpio_init(ARDUINO_PIN_4, GPIO_OUT));
gpio_set(ARDUINO_PIN_4);
ASSERT_NO_ERROR(gpio_init_int(ARDUINO_PIN_3, GPIO_IN, GPIO_BOTH, gpio_cb, &cnt));
/* no stray IRQ */
brief_delay();
failed |= TEST(atomic_load(&cnt) == 0);
/* IRQ on falling edge */
gpio_clear(ARDUINO_PIN_4);
brief_delay();
failed |= TEST(atomic_load(&cnt) == 1);
/* another IRQ on rising edge */
gpio_set(ARDUINO_PIN_4);
brief_delay();
failed |= TEST(atomic_load(&cnt) == 2);
/* and another IRQ on falling edge */
gpio_clear(ARDUINO_PIN_4);
brief_delay();
failed |= TEST(atomic_load(&cnt) == 3);
/* and another IRQ on rising edge */
gpio_set(ARDUINO_PIN_4);
brief_delay();
failed |= TEST(atomic_load(&cnt) == 4);
/* no IRQs while disabled */
gpio_irq_disable(ARDUINO_PIN_3);
gpio_clear(ARDUINO_PIN_4);
brief_delay();
gpio_set(ARDUINO_PIN_4);
brief_delay();
gpio_clear(ARDUINO_PIN_4);
brief_delay();
gpio_set(ARDUINO_PIN_4);
brief_delay();
failed |= TEST(atomic_load(&cnt) == 4);
/* no stray IRQs when re-enabled */
gpio_irq_enable(ARDUINO_PIN_3);
failed |= TEST(atomic_load(&cnt) == 4);
/* an IRQ on falling edge */
gpio_clear(ARDUINO_PIN_4);
brief_delay();
failed |= TEST(atomic_load(&cnt) == 5);
/* another IRQ on rising edge */
gpio_set(ARDUINO_PIN_4);
brief_delay();
failed |= TEST(atomic_load(&cnt) == 6);
print_result(failed);
return failed;
}
static bool periph_gpio_irq_test(void)
{
bool failed = false;
failed |= periph_gpio_irq_test_falling();
failed |= periph_gpio_irq_test_rising();
failed |= periph_gpio_irq_test_both();
return failed;
}
static bool periph_i2c_test(void)
{
bool failed = false;
print_start("I2C", "GPIO extender");
ASSERT_NO_ERROR(gpio_init(ARDUINO_PIN_8, GPIO_IN));
ASSERT_NO_ERROR(gpio_init(ARDUINO_PIN_9, GPIO_OUT));
ASSERT_NO_ERROR(pcf857x_gpio_init(&egpios, PCF857X_GPIO_PIN(0, 0), GPIO_OUT));
ASSERT_NO_ERROR(pcf857x_gpio_init(&egpios, PCF857X_GPIO_PIN(0, 1), GPIO_IN));
for (unsigned i = 0; i < flaky_test_repetitions; i++) {
gpio_set(ARDUINO_PIN_9);
failed |= TEST(pcf857x_gpio_read(&egpios, PCF857X_GPIO_PIN(0, 1)) != 0);
gpio_clear(ARDUINO_PIN_9);
failed |= TEST(pcf857x_gpio_read(&egpios, PCF857X_GPIO_PIN(0, 1)) == 0);
}
for (unsigned i = 0; i < flaky_test_repetitions; i++) {
pcf857x_gpio_set(&egpios, PCF857X_GPIO_PIN(0, 0));
failed |= TEST(gpio_read(ARDUINO_PIN_8) != 0);
pcf857x_gpio_clear(&egpios, PCF857X_GPIO_PIN(0, 0));
failed |= TEST(gpio_read(ARDUINO_PIN_8) == 0);
}
print_result(failed);
return failed;
}
static void uart_rx_cb(void *arg, uint8_t data)
{
(void)arg;
if (serial_buf.pos < sizeof(serial_buf.data)) {
serial_buf.data[serial_buf.pos] = data;
}
serial_buf.pos++;
}
static bool periph_uart_rxtx_test(uint32_t symbolrate, uint32_t timer_freq)
{
bool failed = 0;
uint16_t duration_ticks = 0;
uint16_t bit_ticks = 0;
uint16_t start;
memset(&serial_buf, 0, sizeof(serial_buf));
ASSERT_NO_ERROR(uart_init(UART_TEST_DEV, symbolrate, uart_rx_cb, NULL));
if (IS_USED(MODULE_PERIPH_TIMER)) {
bit_ticks = timer_freq / symbolrate;
duration_ticks = 9ULL * sizeof(testdata) * bit_ticks;
}
/* test that data send matches data received */
if (IS_USED(MODULE_PERIPH_TIMER)) {
start = timer_read(TIMER);
}
uart_write(UART_TEST_DEV, (void *)testdata, sizeof(testdata));
if (IS_USED(MODULE_PERIPH_TIMER)) {
uint16_t stop = timer_read(TIMER);
/* expecting actual duration within 75% to 200% of the expected. */
failed |= TEST(stop - start > duration_ticks - (duration_ticks >> 2));
failed |= TEST(stop - start < (duration_ticks << 1));
if (failed && DETAILED_OUTPUT) {
printf("%" PRIu32 " Bd, expected %" PRIu16 " ticks, got %" PRIu16
" ticks\n",
symbolrate, duration_ticks, (uint16_t)(stop - start));
}
}
long_delay();
failed |= TEST(memcmp(testdata, serial_buf.data, sizeof(serial_buf.data)) == 0);
failed |= TEST(serial_buf.pos == sizeof(testdata));
/* test that no data is received when UART is off */
uart_poweroff(UART_TEST_DEV);
uart_write(UART_TEST_DEV, (void *)testdata, sizeof(testdata));
long_delay();
failed |= TEST(serial_buf.pos == sizeof(testdata));
/* test that data is received again when UART is back on */
memset(&serial_buf, 0, sizeof(serial_buf));
uart_poweron(UART_TEST_DEV);
long_delay();
/* no data expected yet */
failed |= TEST(serial_buf.pos == 0);
/* now writing with device back online */
uart_write(UART_TEST_DEV, (void *)testdata, sizeof(testdata));
long_delay();
failed |= TEST(memcmp(testdata, serial_buf.data, sizeof(serial_buf.data)) == 0);
failed |= TEST(serial_buf.pos == sizeof(testdata));
return failed;
}
static bool periph_uart_test_slow(uint32_t timer_freq)
{
bool failed = false;
print_start("UART", "slow");
failed |= periph_uart_rxtx_test(9600, timer_freq);
print_result(failed);
return failed;
}
static bool periph_uart_test_fast(uint32_t timer_freq)
{
bool failed = false;
print_start("UART", "fast");
failed |= periph_uart_rxtx_test(115200, timer_freq);
print_result(failed);
return failed;
}
static bool periph_uart_test(void)
{
bool failed = false;
uint32_t timer_freq = TIMER_FREQ_UART_TEST;
/* Select a frequency >= TIMER_FREQ_UART_TEST that is closest to it. If no
* such exists, select the highest supported frequency instead. */
if (IS_USED(MODULE_PERIPH_TIMER_QUERY_FREQS)) {
timer_freq = timer_query_freqs(TIMER, 0);
for (uword_t i = 0; i < timer_query_freqs_numof(TIMER); i++) {
uint32_t tmp = timer_query_freqs(TIMER, i);
if (tmp < TIMER_FREQ_UART_TEST) {
break;
}
timer_freq = tmp;
}
}
if (IS_USED(MODULE_PERIPH_TIMER)) {
ASSERT_NO_ERROR(timer_init(TIMER, timer_freq, NULL, NULL));
timer_start(TIMER);
}
failed |= periph_uart_test_slow(timer_freq);
failed |= periph_uart_test_fast(timer_freq);
return failed;
}
static bool periph_spi_rxtx_test(spi_t bus, spi_mode_t mode, spi_clk_t clk,
uint32_t clk_hz, gpio_t clk_check, bool idle_level,
const char *test_in_detail,
uint32_t timer_freq)
{
(void)test_in_detail;
bool failed = false;
bool transfer_too_fast = false;
print_start("SPI", test_in_detail);
uint16_t byte_transfer_ticks = 0;
memset(&serial_buf, 0, sizeof(serial_buf));
if (IS_USED(MODULE_PERIPH_TIMER)) {
byte_transfer_ticks = 8ULL * timer_freq / clk_hz;
}
/* D10 is C̅S̅, D7 is connected to C̅S̅ */
spi_cs_t cs = ARDUINO_PIN_10;
gpio_t cs_check = ARDUINO_PIN_7;
gpio_init(cs_check, GPIO_IN);
spi_init_cs(bus, cs);
spi_acquire(bus, cs, mode, clk);
if (IS_USED(MODULE_PCF857X)) {
failed |= TEST(idle_level == (bool)pcf857x_gpio_read(&egpios, clk_check));
}
/* C̅S̅ should still be HIGH while no chip is selected */
failed |= TEST(gpio_read(cs_check) != 0);
uint16_t byte_time;
for (uint8_t i = 0; i < UINT8_MAX; i++) {
uint16_t start = 0;
if (IS_USED(MODULE_PERIPH_TIMER)) {
start = timer_read(TIMER);
}
uint8_t received = spi_transfer_byte(bus, cs, true, i);
uint16_t stop = 0;
if (IS_USED(MODULE_PERIPH_TIMER)) {
stop = timer_read(TIMER);
}
failed |= TEST(received == i);
if (IS_USED(MODULE_PERIPH_TIMER)) {
byte_time = (uint16_t)(stop - start);
/* We allow the actual SPI clock to be slower than requested, but
* not faster. So the transfer needs to take *at least* the
* theoretical time. Given the overhead of, this already has some
* room for error */
transfer_too_fast |= (byte_time < byte_transfer_ticks);
}
/* C̅S̅ should be still LOW while chip is selected */
failed |= TEST(gpio_read(cs_check) == 0);
}
if (DETAILED_OUTPUT && transfer_too_fast) {
printf("Ticks expected to transfer byte: >= %" PRIu16 ", but got: %"
PRIu16 "\n",
byte_transfer_ticks, byte_time);
}
failed |= TEST(!transfer_too_fast);
failed |= TEST(spi_transfer_byte(bus, cs, false, UINT8_MAX) == UINT8_MAX);
/* C̅S̅ should be again HIGH while now that no chip is selected */
failed |= TEST(gpio_read(cs_check) != 0);
/* no also test for different sizes */
for (unsigned i = 1; i <= sizeof(testdata); i++) {
uint8_t target[sizeof(testdata) + 4];
memset(target, 0x55, sizeof(target));
/* C̅S̅ should be HIGH before chip is selected */
failed |= TEST(gpio_read(cs_check) != 0);
spi_transfer_bytes(bus, cs, false, testdata, target, i);
/* C̅S̅ should be HIGH again after transfer */
failed |= TEST(gpio_read(cs_check) != 0);
/* first part of data read should be the test data */
for (unsigned j = 0; j < i; j++) {
failed |= TEST(target[j] == testdata[j]);
}
/* rest of the target should be the canary value */
for (unsigned j = i; j < sizeof(testdata); j++) {
failed |= TEST(target[j] == 0x55);
}
}
if (IS_USED(MODULE_PCF857X)) {
failed |= TEST(idle_level == (bool)pcf857x_gpio_read(&egpios, clk_check));
}
spi_release(bus);
print_result(failed);
return failed;
}
static bool periph_spi_test(void)
{
uint32_t timer_freq = TIMER_FREQ_SPI_TEST;
/* Select a frequency >= TIMER_FREQ_SPI_TEST that is closest to it. If no
* such exists, select the highest supported frequency instead. */
if (IS_USED(MODULE_PERIPH_TIMER_QUERY_FREQS)) {
timer_freq = timer_query_freqs(TIMER, 0);
for (uword_t i = 0; i < timer_query_freqs_numof(TIMER); i++) {
uint32_t tmp = timer_query_freqs(TIMER, i);
if (tmp < TIMER_FREQ_SPI_TEST) {
break;
}
timer_freq = tmp;
}
}
if (IS_USED(MODULE_PERIPH_TIMER)) {
ASSERT_NO_ERROR(timer_init(TIMER, timer_freq, NULL, NULL));
timer_start(TIMER);
}
bool failed = false;
static const spi_clk_t clocks[] = { SPI_CLK_400KHZ, SPI_CLK_1MHZ, SPI_CLK_10MHZ };
static const uint32_t clk_hzs[] = { KHZ(400), MHZ(1), MHZ(10) };
if (IS_USED(MODULE_PCF857X)) {
for (int i = 0; i < (int)ARRAY_SIZE(spi_clk_check_pins); i++) {
ASSERT_NO_ERROR(pcf857x_gpio_init(&egpios, spi_clk_check_pins[i], GPIO_IN));
}
}
/* using a signed comparison here to also compile when no SPI buses are
* available for testing */
for (int i = 0; i < (int)ARRAY_SIZE(spi_buses); i++) {
spi_t bus = spi_buses[i];
gpio_t clk_check = spi_clk_check_pins[i];
for (unsigned j = 0; j < ARRAY_SIZE(clocks); j++) {
spi_clk_t clk = clocks[j];
uint32_t clk_hz = clk_hzs[j];
if (DETAILED_OUTPUT) {
printf("SPI CLK %" PRIu32 " Hz\n", clk_hz);
}
failed |= periph_spi_rxtx_test(bus, SPI_MODE_0, clk, clk_hz, clk_check, false, "mode 0", timer_freq);
failed |= periph_spi_rxtx_test(bus, SPI_MODE_1, clk, clk_hz, clk_check, false, "mode 1", timer_freq);
failed |= periph_spi_rxtx_test(bus, SPI_MODE_2, clk, clk_hz, clk_check, true, "mode 2", timer_freq);
failed |= periph_spi_rxtx_test(bus, SPI_MODE_3, clk, clk_hz, clk_check, true, "mode 3", timer_freq);
}
}
return failed;
}
static bool periph_pwm_test_chan(pwm_t pwm_dev, uint8_t pwm_chan, pwm_mode_t pwm_mode, adc_t adc_line)
{
bool failed = false;
print_start("PWM", "duty cycle (via ADC)");
failed |= TEST(pwm_init(pwm_dev, pwm_mode, CLOCK_CORECLOCK, 256) > 0);
if (failed) {
/* pwm mode not supported, most likely */
return failed;
}
ASSERT_NO_ERROR(adc_init(adc_line));
for (uint16_t i = 0; i <= UINT8_MAX; i++) {
pwm_set(pwm_dev, pwm_chan, i);
/* give voltage at ADC some time to settle */
brief_delay();
uint16_t sample = adc_sample(adc_line, ADC_RES_10BIT);
uint16_t expected = i << 2;
/* let's allow for quite some error here */
const uint16_t delta = 64;
uint16_t lower = expected <= delta ? 0 : expected - delta;
uint16_t upper = MIN(1023, expected + delta);
bool test_failed = TEST((lower <= sample) && (upper >= sample));
if (test_failed) {
printf("%" PRIu16 " <= %" PRIu16 " <= %" PRIu16": FAILED\n",
lower, sample, upper);
}
failed |= test_failed;
}
print_result(failed);
return failed;
}
static bool periph_pwm_test(void)
{
bool failed = false;
static const pwm_mode_t modes[] = { PWM_LEFT, PWM_RIGHT, PWM_CENTER };
for (unsigned i = 0; i < ARRAY_SIZE(modes); i++) {
if (ENABLE_PWM_TEST_D5) {
failed |= periph_pwm_test_chan(ARDUINO_PIN_5_PWM_DEV, ARDUINO_PIN_5_PWM_CHAN, modes[i], ARDUINO_A2);
}
if (ENABLE_PWM_TEST_D6) {
failed |= periph_pwm_test_chan(ARDUINO_PIN_6_PWM_DEV, ARDUINO_PIN_6_PWM_CHAN, modes[i], ARDUINO_A1);
}
}
return failed;
}
static void r_2r_dac_init(void)
{
ASSERT_NO_ERROR(pcf857x_gpio_init(&egpios, PCF857X_GPIO_PIN(0, 4), GPIO_OUT));
ASSERT_NO_ERROR(pcf857x_gpio_init(&egpios, PCF857X_GPIO_PIN(0, 5), GPIO_OUT));
ASSERT_NO_ERROR(pcf857x_gpio_init(&egpios, PCF857X_GPIO_PIN(0, 6), GPIO_OUT));
ASSERT_NO_ERROR(pcf857x_gpio_init(&egpios, PCF857X_GPIO_PIN(0, 7), GPIO_OUT));
}
static void r_2r_dac_write(uint8_t val)
{
pcf857x_gpio_write(&egpios, PCF857X_GPIO_PIN(0, 4), val & (1U << 3));
pcf857x_gpio_write(&egpios, PCF857X_GPIO_PIN(0, 5), val & (1U << 2));
pcf857x_gpio_write(&egpios, PCF857X_GPIO_PIN(0, 6), val & (1U << 1));
pcf857x_gpio_write(&egpios, PCF857X_GPIO_PIN(0, 7), val & (1U << 0));
}
static bool periph_adc_test(void)
{
bool failed = false;
print_start("ADC", "sample R2R DAC output");
adc_init(ARDUINO_A0);
r_2r_dac_init();
for (uint8_t i = 0; i < 16; i++) {
r_2r_dac_write(i);
uint16_t sample = adc_sample(ARDUINO_A0, ADC_RES_10BIT);
uint16_t expected = i << 6;
/* The resistors on board v0.3 are not that accurate, so allow for 10%
* error margin */
const uint16_t delta = 1024 / 10;
uint16_t lower = expected <= delta ? 0 : expected - delta;
uint16_t upper = MIN(1023, expected + delta);
bool test_failed = TEST((lower <= sample) && (upper >= sample));
if (test_failed) {
printf("%" PRIu16 " <= %" PRIu16 " <= %" PRIu16": FAILED\n",
lower, sample, upper);
}
failed |= test_failed;
}
print_result(failed);
return failed;
}
int main(void)
{
bool failed = false;
printf("self-testing peripheral drivers\n"
"===============================\n");
/* the GPIO extender is used by the I2C test and the ADC test, so only
* initialize it once here */
if (IS_USED(MODULE_PCF857X)) {
ASSERT_NO_ERROR(pcf857x_init(&egpios, &params));
}
if (IS_USED(MODULE_PERIPH_GPIO)) {
failed |= periph_gpio_test();
}
if (IS_USED(MODULE_PERIPH_GPIO_IRQ)) {
failed |= periph_gpio_irq_test();
}
if (IS_USED(MODULE_PCF857X) && IS_USED(MODULE_PERIPH_GPIO)) {
failed |= periph_i2c_test();
}
if (ENABLE_UART_TEST) {
failed |= periph_uart_test();
}
if (IS_USED(MODULE_PERIPH_SPI)) {
failed |= periph_spi_test();
}
if (ENABLE_PWM_TEST) {
failed |= periph_pwm_test();
}
if (ENABLE_ADC_TEST) {
failed |= periph_adc_test();
}
if (failed) {
printf("\n\nSOME TESTS FAILED\n");
return 1;
}
printf("\n\nALL TESTS SUCCEEDED\n");
return 0;
}
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