The API was based on the assumption that GPIO ports are mapped in memory
sanely, so that a `GPIO_PORT(num)` macro would work allow for constant
folding when `num` is known and still be efficient when it is not.
Some MCUs, however, will need a look up tables to efficiently translate
GPIO port numbers to the port's base address. This will prevent the use
of such a `GPIO_PORT(num)` macro in constant initializers.
As a result, we rather provide `GPIO_PORT_0`, `GPIO_PORT_1`, etc. macros
for each GPIO port present (regardless of MCU naming scheme), as well as
`GPIO_PORT_A`, `GPIO_PORT_B`, etc. macros if (and only if) the MCU port
naming scheme uses letters rather than numbers.
These can be defined as macros to the peripheral base address even when
those are randomly mapped into the address space. In addition, a C
function `gpio_port()` replaces the role of the `GPIO_PORT()` and
`gpio_port_num()` the `GPIO_PORT_NUM()` macro. Those functions will
still be implemented as efficient as possible and will allow constant
folding where it was formerly possible. Hence, there is no downside for
MCUs with sane peripheral memory mapping, but it is highly beneficial
for the crazy ones.
There are also two benefits for the non-crazy MCUs:
1. We can now test for valid port numbers with `#ifdef GPIO_PORT_<NUM>`
- This directly benefits the test in `tests/periph/gpio_ll`, which
can now provide a valid GPIO port for each and every board
- Writing to invalid memory mapped I/O addresses was treated as
triggering undefined behavior by the compiler and used as a
optimization opportunity
2. We can now detect at compile time if the naming scheme of the MCU
uses letters or numbers, and produce more user friendly output.
- This is directly applied in the test app
When it is difficult to navigate a function, it is overdue to split
it up :D
Also, no need to test for feature `gpio_ll_irq` in `test_irq()` *and*
before calling `test_irq()`.
The documentation on the state `GPIO_DISCONNECT` was a bit vague. The
API doc said it should disconnect the GPIO from all peripherals, the
test also tested them for being electrically disconnected.
The documentation in both the test and the API is extended to point out
that a GPIO indeed SHOULD be in high impedance state, but that user
MUST NOT expect that this requested is honored by every implementation
and for every GPIO pin.
In the test it is also pointed out that failing the test for a GPIO
in the `GPIO_DISCONNECT` state being electrically disconnected is for
some pins expected, and that the test should be just run again with
different GPIOs. The test intentionally tests for a feature not provided
by every GPIO pin rather than warning on a failure: The effort to just
flash and run the test again with different GPIOs is relatively low, but
it does confirm correct behavior of the API.
When using level triggered IRQs, a new IRQ flag may already have been
set while the IRQ callback is executed. Hence, we cannot just toggle
the output, but rather should drive it low/high for a level trigger on
high/low.
Also test `gpio_ll_query_conf()` for the disconnected state as well.
Printing the newline after the state was printed is not optional.
This also moves the call to `gpio_ll_print_conf()` and `puts("")` to
a static function to safe enough ROM so that this still can be flashed
on `nucleo-l011k4`.
