The test (at least locally) fails on the long shell line detection in
`master`, as the EDBG UART adapter drops chars when more than 64 bytes
are send at a time. This works around the issue:
- The line buffer in the test is reduced to 60 bytes, so that
overflowing it becomes possible with sending less than 64 bytes.
- The test script is adapted to exceed the shell buffer size by one
byte only (due to linefeed char), rather than significantly.
- Sending more than 64 bytes would result in the linefeed being
dropped by the EDBG adapter and the test failing
Finally, the shell buffer is no longer allocated on the stack and,
hence, the main stack size could be reduced a bit. The test still
passes on the Nucleo-F767ZI which is notorious in failing on tight
stacks due to the MPU stack guard - so the stack size reduction is
expected to work for all boards.
- Define test_utils_interactive_sync as DEFAULT_MODULE in Makefile.tests_common
- For tests disabling autoinit, add test_utils_interactive_sync to main
- Add DISABLE_MODULE += test_utils_interactive_sync for tests requiring
sudo, `tests/shell`, `tests/minimal` and `tests/stdin`
- Add shell_commands to tests/periph_wdt and tests/struct_tm_utility to
pull `r` and `s` commands
- Remove includes and usage in `tests/main.c` for tests that where
already using test_utils_interactive_sync
For test scripts, a terminal that does not modify the input and output
streams, configured without local echo, is preferred as it ensures the
test setup is introducing as little noise as possible.
Added arduino-nano to BOARD_INSUFFICIENT_MEMORY/BOARD_BLACKLIST following suit
of how arduino-uno is marked, as arduino-nano is mostly an Uno in a different
form factor.
