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Merge pull request #8577 from gebart/pr/analog_util-refactor

sys/analog_util: Refactor, add test
This commit is contained in:
Kaspar Schleiser 2018-04-17 10:40:53 +02:00 committed by GitHub
commit f18f25c5c2
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6 changed files with 156 additions and 15 deletions

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@ -1,4 +1,5 @@
/*
* Copyright (C) 2018 Eistec AB
* Copyright (C) 2015 Freie Universität Berlin
*
* This file is subject to the terms and conditions of the GNU Lesser
@ -14,28 +15,58 @@
* @brief ADC utility function implementation
*
* @author Hauke Petersen <hauke.petersen@fu-berlin.de>
* @author Joakim Nohlgård <joakim.nohlgard@eistec.se>
*
* @}
*/
#include <stdint.h>
#include <inttypes.h>
#include "cpu.h"
#include "periph/adc.h"
#include "analog_util.h"
#include "assert.h"
/* keep a max value to ADC resolution mapping for quick access in the ROM */
static const int val_max[] = {
[ADC_RES_6BIT] = 0x003f,
[ADC_RES_8BIT] = 0x00ff,
[ADC_RES_10BIT] = 0x03ff,
[ADC_RES_12BIT] = 0x0fff,
[ADC_RES_14BIT] = 0x3fff,
[ADC_RES_16BIT] = 0xffff
};
#define ENABLE_DEBUG (0)
#include "debug.h"
int adc_util_map(int sample, adc_res_t res, int min, int max)
/**
* @brief Convert adc_res_t resolution setting into numeric bit count
*/
static unsigned int _adc_res_bits(adc_res_t res)
{
return ((((max - min) * sample) / val_max[res]) + min);
switch (res) {
case ADC_RES_6BIT:
return 6;
case ADC_RES_8BIT:
return 8;
case ADC_RES_10BIT:
return 10;
case ADC_RES_12BIT:
return 12;
case ADC_RES_14BIT:
return 14;
case ADC_RES_16BIT:
return 16;
default:
/* Unsupported ADC resolution, modify your application to use a
* different resolution, or add it above */
assert(0 == 1);
return 0;
}
}
int32_t adc_util_map(int sample, adc_res_t res, int32_t min, int32_t max)
{
/* Using 64 bit signed int as intermediate to prevent overflow when range
* multiplied by sample requires more than 32 bits */
int32_t scaled = (((int64_t)(max - min) * sample) >> _adc_res_bits(res));
DEBUG("scaled: %" PRId32 "\n", scaled);
return (min + scaled);
}
float adc_util_mapf(int sample, adc_res_t res, float min, float max)
{
return ((((max - min) * sample) / val_max[res]) + min);
return ((((max - min) * sample) / ((int32_t)1L << _adc_res_bits(res))) + min);
}

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@ -21,6 +21,8 @@
#ifndef ANALOG_UTIL_H
#define ANALOG_UTIL_H
#include <stdint.h>
#include "periph/adc.h"
#ifdef __cplusplus
@ -33,8 +35,6 @@ extern "C" {
* This function is useful for converting sampled ADC values into their physical
* representation.
*
* The min value is asserted to be smaller than the max value.
*
* @param[in] sample sampled ADC value
* @param[in] res ADC resolution
* @param[in] min the lower bound of the target interval
@ -42,7 +42,7 @@ extern "C" {
*
* @return the mapped value
*/
int adc_util_map(int sample, adc_res_t res, int min, int max);
int32_t adc_util_map(int sample, adc_res_t res, int32_t min, int32_t max);
/**
* @brief Map a sampled ADC value to a given range (using floating point

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include $(RIOTBASE)/Makefile.base

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USEMODULE += analog_util

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/*
* Copyright (C) 2018 Eistec AB
*
* This file is subject to the terms and conditions of the GNU Lesser
* General Public License v2.1. See the file LICENSE in the top level
* directory for more details.
*/
#include "embUnit.h"
#include "tests-analog_util.h"
#include "analog_util.h"
#define ENABLE_DEBUG (0)
#include "debug.h"
typedef struct {
int32_t expected;
int sample;
int32_t min;
int32_t max;
adc_res_t res;
} test_values_t;
/* Arbitrarily chosen test vectors */
/* TODO: Choose test vectors in a more qualified manner to catch any edge cases */
static test_values_t test_data[] = {
{ 0L, 0, 0L, 10000L, ADC_RES_16BIT},
{ 1000L, 0, 1000L, 0L, ADC_RES_16BIT},
{ 65535L, 65535, 0L, 65536L, ADC_RES_16BIT},
{ 32768L, 128, 0L, 65536L, ADC_RES_8BIT},
{ 8192L, 128, 0L, 65536L, ADC_RES_10BIT},
{ 256L, 1, 0L, 65536L, ADC_RES_8BIT},
{ 65280L, 255, 0L, 65536L, ADC_RES_8BIT},
{ 1039L, 10, 1000L, 2000L, ADC_RES_8BIT},
{ 17324L, 3000, 10000L, 20000L, ADC_RES_12BIT},
{ 11831L, 3000, 10000L, 20000L, ADC_RES_14BIT},
{ 2301L, 3000, 13L, 50000L, ADC_RES_16BIT},
{ -134L, 56789, -1000L, 0L, ADC_RES_16BIT},
{ 16062L, 45671, 30000L, 10000L, ADC_RES_16BIT},
{ -2535L, 30000, -30000L, 30000L, ADC_RES_16BIT},
{ 0L, 65535, 65535L, 0L, ADC_RES_16BIT},
{ 65534L, 1, 65535L, 0L, ADC_RES_16BIT},
{ 3972L, 9876, 10000L, 0L, ADC_RES_14BIT},
};
#define TEST_DATA_NUMOF (sizeof(test_data) / sizeof(test_data[0]))
static void test_adc_util_map(void)
{
for (unsigned int k = 0; k < TEST_DATA_NUMOF; ++k) {
test_values_t *testp = &test_data[k];
int32_t res = adc_util_map(testp->sample, testp->res, testp->min, testp->max);
TEST_ASSERT_EQUAL_INT(testp->expected, res);
}
}
Test *tests_adc_util_tests(void)
{
EMB_UNIT_TESTFIXTURES(fixtures) {
new_TestFixture(test_adc_util_map),
};
EMB_UNIT_TESTCALLER(adc_util_tests, NULL, NULL, fixtures);
return (Test *)&adc_util_tests;
}
void tests_analog_util(void)
{
TESTS_RUN(tests_adc_util_tests());
}

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/*
* Copyright (C) 2018 Eistec AB
*
* This file is subject to the terms and conditions of the GNU Lesser
* General Public License v2.1. See the file LICENSE in the top level
* directory for more details.
*/
/**
* @addtogroup unittests
* @{
*
* @file
* @brief Unittests for the ``adc_utils`` header
*
* @author Joakim Nohlgård <joakim.nohlgard@eistec.se>
*/
#ifndef TESTS_ANALOG_UTIL_H
#define TESTS_ANALOG_UTIL_H
#include "embUnit/embUnit.h"
#ifdef __cplusplus
extern "C" {
#endif
/**
* @brief The entry point of this test suite.
*/
void tests_adc_util(void);
#ifdef __cplusplus
}
#endif
#endif /* TESTS_ANALOG_UTIL_H */
/** @} */