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Merge pull request #8577 from gebart/pr/analog_util-refactor
sys/analog_util: Refactor, add test
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commit
f18f25c5c2
@ -1,4 +1,5 @@
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/*
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* Copyright (C) 2018 Eistec AB
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* Copyright (C) 2015 Freie Universität Berlin
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*
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* This file is subject to the terms and conditions of the GNU Lesser
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@ -14,28 +15,58 @@
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* @brief ADC utility function implementation
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*
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* @author Hauke Petersen <hauke.petersen@fu-berlin.de>
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* @author Joakim Nohlgård <joakim.nohlgard@eistec.se>
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*
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* @}
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*/
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#include <stdint.h>
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#include <inttypes.h>
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#include "cpu.h"
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#include "periph/adc.h"
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#include "analog_util.h"
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#include "assert.h"
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/* keep a max value to ADC resolution mapping for quick access in the ROM */
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static const int val_max[] = {
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[ADC_RES_6BIT] = 0x003f,
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[ADC_RES_8BIT] = 0x00ff,
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[ADC_RES_10BIT] = 0x03ff,
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[ADC_RES_12BIT] = 0x0fff,
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[ADC_RES_14BIT] = 0x3fff,
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[ADC_RES_16BIT] = 0xffff
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};
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#define ENABLE_DEBUG (0)
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#include "debug.h"
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int adc_util_map(int sample, adc_res_t res, int min, int max)
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/**
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* @brief Convert adc_res_t resolution setting into numeric bit count
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*/
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static unsigned int _adc_res_bits(adc_res_t res)
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{
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return ((((max - min) * sample) / val_max[res]) + min);
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switch (res) {
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case ADC_RES_6BIT:
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return 6;
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case ADC_RES_8BIT:
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return 8;
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case ADC_RES_10BIT:
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return 10;
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case ADC_RES_12BIT:
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return 12;
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case ADC_RES_14BIT:
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return 14;
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case ADC_RES_16BIT:
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return 16;
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default:
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/* Unsupported ADC resolution, modify your application to use a
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* different resolution, or add it above */
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assert(0 == 1);
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return 0;
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}
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}
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int32_t adc_util_map(int sample, adc_res_t res, int32_t min, int32_t max)
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{
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/* Using 64 bit signed int as intermediate to prevent overflow when range
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* multiplied by sample requires more than 32 bits */
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int32_t scaled = (((int64_t)(max - min) * sample) >> _adc_res_bits(res));
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DEBUG("scaled: %" PRId32 "\n", scaled);
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return (min + scaled);
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}
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float adc_util_mapf(int sample, adc_res_t res, float min, float max)
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{
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return ((((max - min) * sample) / val_max[res]) + min);
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return ((((max - min) * sample) / ((int32_t)1L << _adc_res_bits(res))) + min);
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}
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@ -21,6 +21,8 @@
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#ifndef ANALOG_UTIL_H
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#define ANALOG_UTIL_H
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#include <stdint.h>
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#include "periph/adc.h"
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#ifdef __cplusplus
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@ -33,8 +35,6 @@ extern "C" {
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* This function is useful for converting sampled ADC values into their physical
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* representation.
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*
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* The min value is asserted to be smaller than the max value.
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*
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* @param[in] sample sampled ADC value
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* @param[in] res ADC resolution
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* @param[in] min the lower bound of the target interval
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@ -42,7 +42,7 @@ extern "C" {
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*
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* @return the mapped value
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*/
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int adc_util_map(int sample, adc_res_t res, int min, int max);
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int32_t adc_util_map(int sample, adc_res_t res, int32_t min, int32_t max);
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/**
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* @brief Map a sampled ADC value to a given range (using floating point
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1
tests/unittests/tests-analog_util/Makefile
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1
tests/unittests/tests-analog_util/Makefile
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include $(RIOTBASE)/Makefile.base
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1
tests/unittests/tests-analog_util/Makefile.include
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1
tests/unittests/tests-analog_util/Makefile.include
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USEMODULE += analog_util
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72
tests/unittests/tests-analog_util/tests-analog_util.c
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72
tests/unittests/tests-analog_util/tests-analog_util.c
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/*
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* Copyright (C) 2018 Eistec AB
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*
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* This file is subject to the terms and conditions of the GNU Lesser
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* General Public License v2.1. See the file LICENSE in the top level
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* directory for more details.
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*/
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#include "embUnit.h"
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#include "tests-analog_util.h"
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#include "analog_util.h"
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#define ENABLE_DEBUG (0)
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#include "debug.h"
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typedef struct {
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int32_t expected;
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int sample;
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int32_t min;
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int32_t max;
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adc_res_t res;
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} test_values_t;
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/* Arbitrarily chosen test vectors */
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/* TODO: Choose test vectors in a more qualified manner to catch any edge cases */
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static test_values_t test_data[] = {
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{ 0L, 0, 0L, 10000L, ADC_RES_16BIT},
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{ 1000L, 0, 1000L, 0L, ADC_RES_16BIT},
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{ 65535L, 65535, 0L, 65536L, ADC_RES_16BIT},
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{ 32768L, 128, 0L, 65536L, ADC_RES_8BIT},
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{ 8192L, 128, 0L, 65536L, ADC_RES_10BIT},
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{ 256L, 1, 0L, 65536L, ADC_RES_8BIT},
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{ 65280L, 255, 0L, 65536L, ADC_RES_8BIT},
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{ 1039L, 10, 1000L, 2000L, ADC_RES_8BIT},
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{ 17324L, 3000, 10000L, 20000L, ADC_RES_12BIT},
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{ 11831L, 3000, 10000L, 20000L, ADC_RES_14BIT},
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{ 2301L, 3000, 13L, 50000L, ADC_RES_16BIT},
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{ -134L, 56789, -1000L, 0L, ADC_RES_16BIT},
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{ 16062L, 45671, 30000L, 10000L, ADC_RES_16BIT},
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{ -2535L, 30000, -30000L, 30000L, ADC_RES_16BIT},
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{ 0L, 65535, 65535L, 0L, ADC_RES_16BIT},
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{ 65534L, 1, 65535L, 0L, ADC_RES_16BIT},
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{ 3972L, 9876, 10000L, 0L, ADC_RES_14BIT},
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};
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#define TEST_DATA_NUMOF (sizeof(test_data) / sizeof(test_data[0]))
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static void test_adc_util_map(void)
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{
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for (unsigned int k = 0; k < TEST_DATA_NUMOF; ++k) {
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test_values_t *testp = &test_data[k];
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int32_t res = adc_util_map(testp->sample, testp->res, testp->min, testp->max);
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TEST_ASSERT_EQUAL_INT(testp->expected, res);
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}
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}
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Test *tests_adc_util_tests(void)
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{
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EMB_UNIT_TESTFIXTURES(fixtures) {
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new_TestFixture(test_adc_util_map),
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};
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EMB_UNIT_TESTCALLER(adc_util_tests, NULL, NULL, fixtures);
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return (Test *)&adc_util_tests;
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}
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void tests_analog_util(void)
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{
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TESTS_RUN(tests_adc_util_tests());
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}
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36
tests/unittests/tests-analog_util/tests-analog_util.h
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36
tests/unittests/tests-analog_util/tests-analog_util.h
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/*
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* Copyright (C) 2018 Eistec AB
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*
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* This file is subject to the terms and conditions of the GNU Lesser
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* General Public License v2.1. See the file LICENSE in the top level
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* directory for more details.
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*/
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/**
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* @addtogroup unittests
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* @{
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*
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* @file
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* @brief Unittests for the ``adc_utils`` header
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*
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* @author Joakim Nohlgård <joakim.nohlgard@eistec.se>
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*/
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#ifndef TESTS_ANALOG_UTIL_H
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#define TESTS_ANALOG_UTIL_H
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#include "embUnit/embUnit.h"
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#ifdef __cplusplus
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extern "C" {
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#endif
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/**
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* @brief The entry point of this test suite.
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*/
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void tests_adc_util(void);
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#ifdef __cplusplus
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}
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#endif
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#endif /* TESTS_ANALOG_UTIL_H */
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/** @} */
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