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tests: unittests: add some bitfield unit tests

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This commit is contained in:
Kaspar Schleiser 2015-07-01 12:05:38 +02:00
parent fb9a862177
commit 43ecf6d2c3
3 changed files with 139 additions and 0 deletions
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1
tests/unittests/tests-bitfield/Makefile Normal file
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include $(RIOTBASE)/Makefile.base

1
tests/unittests/tests-bitfield/Makefile.include Normal file
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USEMODULE += bitfield

137
tests/unittests/tests-bitfield/tests-bitfield.c Normal file
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/*
* Copyright (C) 2015 Kaspar Schleiser <kaspar@schleiser.de>
*
* This file is subject to the terms and conditions of the GNU Lesser
* General Public License v2.1. See the file LICENSE in the top level
* directory for more details.
*/
#include <stdint.h>
#include <string.h>
#include "embUnit.h"
#include "bitfield.h"
static void test_bf_get_unset_empty(void)
{
int res = 0;
uint8_t field[5];
memset(field, 0, sizeof(field));
res = bf_get_unset(field, 0);
TEST_ASSERT_EQUAL_INT(-1, res);
memset(field, 0, sizeof(field));
res = bf_get_unset(field, 1);
TEST_ASSERT_EQUAL_INT(0, res);
memset(field, 0, sizeof(field));
res = bf_get_unset(field, 3);
TEST_ASSERT_EQUAL_INT(0, res);
memset(field, 0, sizeof(field));
res = bf_get_unset(field, 8);
TEST_ASSERT_EQUAL_INT(0, res);
memset(field, 0, sizeof(field));
res = bf_get_unset(field, 9);
TEST_ASSERT_EQUAL_INT(0, res);
memset(field, 0, sizeof(field));
res = bf_get_unset(field, 40);
TEST_ASSERT_EQUAL_INT(0, res);
}
static void test_bf_get_unset_firstbyte(void)
{
int res = 0;
uint8_t field[5];
memset(field, 0xff, sizeof(field));
field[0] = 0x00;
res = bf_get_unset(field, 40);
TEST_ASSERT_EQUAL_INT(0, res);
field[0] = 0x01;
res = bf_get_unset(field, 40);
TEST_ASSERT_EQUAL_INT(1, res);
field[0] = 0x0f;
res = bf_get_unset(field, 40);
TEST_ASSERT_EQUAL_INT(4, res);
field[0] = 0x7f;
res = bf_get_unset(field, 40);
TEST_ASSERT_EQUAL_INT(7, res);
field[0] = 0xff;
res = bf_get_unset(field, 40);
TEST_ASSERT_EQUAL_INT(-1, res);
}
static void test_bf_get_unset_middle(void)
{
int res = 0;
uint8_t field[5];
memset(field, 0xff, sizeof(field));
field[2] = 0x00;
res = bf_get_unset(field, 40);
TEST_ASSERT_EQUAL_INT(16, res);
field[2] = 0x01;
res = bf_get_unset(field, 40);
TEST_ASSERT_EQUAL_INT(17, res);
field[2] = 0x0f;
res = bf_get_unset(field, 40);
TEST_ASSERT_EQUAL_INT(20, res);
field[2] = 0x7f;
res = bf_get_unset(field, 40);
TEST_ASSERT_EQUAL_INT(23, res);
}
static void test_bf_get_unset_lastbyte(void)
{
int res = 0;
uint8_t field[5];
memset(field, 0xff, sizeof(field));
field[4] = 0x00;
res = bf_get_unset(field, 40);
TEST_ASSERT_EQUAL_INT(32, res);
field[4] = 0x01;
res = bf_get_unset(field, 40);
TEST_ASSERT_EQUAL_INT(33, res);
field[4] = 0x0f;
res = bf_get_unset(field, 40);
TEST_ASSERT_EQUAL_INT(36, res);
field[4] = 0x7f;
res = bf_get_unset(field, 40);
TEST_ASSERT_EQUAL_INT(39, res);
}
Test *tests_bitfield_tests(void)
{
EMB_UNIT_TESTFIXTURES(fixtures) {
new_TestFixture(test_bf_get_unset_empty),
new_TestFixture(test_bf_get_unset_firstbyte),
new_TestFixture(test_bf_get_unset_middle),
new_TestFixture(test_bf_get_unset_lastbyte),
};
EMB_UNIT_TESTCALLER(bitfield_tests, NULL, NULL, fixtures);
return (Test *)&bitfield_tests;
}
void tests_bitfield(void)
{
TESTS_RUN(tests_bitfield_tests());
}